Invention Grant
- Patent Title: Bin full detection with light intensity sensing
- Patent Title (中): Bin全检测与光强感应
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Application No.: US12184631Application Date: 2008-08-01
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Publication No.: US08028942B2Publication Date: 2011-10-04
- Inventor: Tai Hoon Kim Matlin , Michael D. Jensen , Jakub M. Krynski
- Applicant: Tai Hoon Kim Matlin , Michael D. Jensen , Jakub M. Krynski
- Applicant Address: US IL Itasca
- Assignee: Fellowes, Inc.
- Current Assignee: Fellowes, Inc.
- Current Assignee Address: US IL Itasca
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: B02C25/00
- IPC: B02C25/00

Abstract:
An assembly has a bin level detection system having at least one sensor positioned to receive radiation reflected off any material deposited in a bin and to determine an intensity of the reflected radiation. The intensity corresponds to an amount or level of shredded material deposited in the bin. The system may detect radiation from one or more emitters, or, alternatively, detect ambient light entering the bin via a window. A level indicator system may also be provided to indicate the amount of material deposited in the bin, including if the bin is full. The assembly may comprise a shredder and a shredder housing.
Public/Granted literature
- US20100025509A1 BIN FULL DETECTION WITH LIGHT INTENSITY SENSING Public/Granted day:2010-02-04
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