Invention Grant
- Patent Title: Liquid ejecting apparatus and ejection inspecting method
- Patent Title (中): 液体喷射装置和喷射检查方法
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Application No.: US12555779Application Date: 2009-09-08
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Publication No.: US08029088B2Publication Date: 2011-10-04
- Inventor: Yasuhiro Hosokawa , Seiji Izuo
- Applicant: Yasuhiro Hosokawa , Seiji Izuo
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Kilpatrick Townsend & Stockton LLP
- Priority: JP2008-231260 20080909
- Main IPC: B41J29/393
- IPC: B41J29/393

Abstract:
A liquid ejecting apparatus includes: a head which ejects a liquid from nozzles; a first electrode which charges the liquid with a first potential; a second electrode which is charged with a second potential different from the first potential; and an inspector which inspects whether the liquid is ejected from the nozzles based on a variation in a potential caused in at least one of the first and second electrodes by ejecting the liquid charged with the first potential from the nozzles to the second electrode and which determines whether the inspection of liquid ejection from the nozzles is normally executed based on the variation in the potential during a non-ejection period in which the liquid is not ejected from all of the nozzles.
Public/Granted literature
- US20100060690A1 LIQUID EJECTING APPARATUS AND EJECTION INSPECTING METHOD Public/Granted day:2010-03-11
Information query
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