Invention Grant
US08030958B2 System for providing a reference voltage to a semiconductor integrated circuit
有权
用于向半导体集成电路提供参考电压的系统
- Patent Title: System for providing a reference voltage to a semiconductor integrated circuit
- Patent Title (中): 用于向半导体集成电路提供参考电压的系统
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Application No.: US11878498Application Date: 2007-07-25
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Publication No.: US08030958B2Publication Date: 2011-10-04
- Inventor: Yong-hwan Noh
- Applicant: Yong-hwan Noh
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2006-0132029 20061221
- Main IPC: G01R31/26
- IPC: G01R31/26
Abstract:
A system for providing a reference voltage includes a tester adapted to provide a predetermined current, a first ground pad connected to a ground voltage of the tester, a second ground pad connected between the tester and the first ground pad, the second ground pad being connected to the tester through first and second resistors, a reference voltage pad connected to a node between the first and second resistors, the reference voltage pad adapted to provide a test reference voltage, and a multiplexer connected to the reference voltage pad, the multiplexer configured to output the test reference voltage as a reference voltage during substantial voltage variation.
Public/Granted literature
- US20080150615A1 System for providing a reference voltage to a semiconductor integrated circuit Public/Granted day:2008-06-26
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