Invention Grant
- Patent Title: Method for determining an influencing variable acting on the eccentricity in a goniometer
- Patent Title (中): 确定作用在测角器偏心度的影响变量的方法
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Application No.: US12522198Application Date: 2007-12-06
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Publication No.: US08031334B2Publication Date: 2011-10-04
- Inventor: Heinz Lippuner , Knut Siercks , Beat Aebischer
- Applicant: Heinz Lippuner , Knut Siercks , Beat Aebischer
- Applicant Address: CH Heerbrugg
- Assignee: Leica Geosystems AG
- Current Assignee: Leica Geosystems AG
- Current Assignee Address: CH Heerbrugg
- Agency: Maschoff Gilmore & Israelsen
- Priority: EP07100296 20070109
- International Application: PCT/EP2007/010574 WO 20071206
- International Announcement: WO2008/083797 WO 20080717
- Main IPC: G01B11/26
- IPC: G01B11/26

Abstract:
The invention relates to a method for determining at least one influencing variable acting on the eccentricity in a goniometer, using a detector arrangement consisting of four optical detector elements, and a rotational body comprising a plurality of pattern elements arranged around a pattern center, the rotational body being rotatably arranged about an axis. According to said method, at least some of the pattern elements are reproduced on the detector arrangement, the positions of the pattern elements reproduced on the detector arrangement are resolved, and the eccentricity of the pattern center in relation to a detector center of the detector arrangement is determined. A plurality of such eccentricity measurements for different rotational positions enables different influencing variables acting on the current eccentricity to be separated, especially by forming units.
Public/Granted literature
- US20100039656A1 METHOD FOR DETERMINING AN INFLUENCING VARIABLE ACTING ON THE ECCENTRICITY IN A GONIOMETER Public/Granted day:2010-02-18
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