Invention Grant
- Patent Title: Memory and reading method thereof
- Patent Title (中): 其记忆和阅读方法
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Application No.: US12183285Application Date: 2008-07-31
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Publication No.: US08031523B2Publication Date: 2011-10-04
- Inventor: Chun-Hsiung Hung , Hsin-Yi Ho
- Applicant: Chun-Hsiung Hung , Hsin-Yi Ho
- Applicant Address: TW Hsinchu
- Assignee: Macronix International Co., Ltd.
- Current Assignee: Macronix International Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Thomas|Kayden
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/04

Abstract:
A method for reading a memory, which includes a memory cell having a first half cell and a second half cell, includes the following steps. A first voltage is applied to the memory cell to determine whether a threshold voltage of the first half cell is higher than a predetermined value or not. If the threshold voltage of the first half cell is higher than the predetermined value, a second voltage higher than the first voltage is applied to the memory cell to read data stored in the second half cell, otherwise a third voltage lower than the first voltage is applied to the memory cell to read the data stored in the second half cell.
Public/Granted literature
- US20100027331A1 MEMORY AND READING METHOD THEREOF Public/Granted day:2010-02-04
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