Invention Grant
US08031910B2 Method and apparatus for analyzing quality traits of grain or seed
有权
分析谷物或种子品质性状的方法和装置
- Patent Title: Method and apparatus for analyzing quality traits of grain or seed
- Patent Title (中): 分析谷物或种子品质性状的方法和装置
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Application No.: US10928760Application Date: 2004-08-27
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Publication No.: US08031910B2Publication Date: 2011-10-04
- Inventor: Michael A. Jones , David J. Foster , Doris M. Rimathe
- Applicant: Michael A. Jones , David J. Foster , Doris M. Rimathe
- Applicant Address: CH Basel
- Assignee: Syngenta Participations AG
- Current Assignee: Syngenta Participations AG
- Current Assignee Address: CH Basel
- Agent Dana Rewoldt
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
The present invention relates generally to an apparatus for and a method of measuring and selecting grain for use in milling, or seed for use in plant breeding. Said method is adapted to optically analyze seeds/grains to qualitatively and quantitatively characterize the seed/grain, and more particularly, to analyze the gradation of color, whiteness, and hard endosperm of the seed/grain. This method and apparatus perform color image analysis of seed/grain sample(s) to characterize multiple quality traits.
Public/Granted literature
- US20050074146A1 Method and apparatus for analyzing quality traits of grain or seed Public/Granted day:2005-04-07
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