Invention Grant
US08032234B2 Diagnostics in process control and monitoring systems 有权
过程控制和监控系统中的诊断

Diagnostics in process control and monitoring systems
Abstract:
A condition of an industrial process is diagnosed based upon process variable information related to a value of a measured process variable. Histogram information is calculated based upon the determined process variable information and time information related to a duration of time the measured process variable has the value. Condition of the industrial process is diagnosed based upon the calculated histogram information.
Public/Granted literature
Information query
Patent Agency Ranking
0/0