Invention Grant
- Patent Title: Structure for an absolute duty cycle measurement circuit
- Patent Title (中): 绝对占空比测量电路的结构
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Application No.: US12129945Application Date: 2008-05-30
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Publication No.: US08032850B2Publication Date: 2011-10-04
- Inventor: David W. Boerstler , Eskinder Hailu , Masaaki Kaneko , Jieming Qi , Bin Wan
- Applicant: David W. Boerstler , Eskinder Hailu , Masaaki Kaneko , Jieming Qi , Bin Wan
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Stephen J. Walder, Jr.; Matthew B Talpis
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G01R23/00 ; G01R29/26

Abstract:
A design structure for a circuit for measuring the absolute duty cycle of a signal, is provided. A non-inverted path from a signal source is selected and various DCC circuit setting indices are cycled through until a divider, coupled to the output of the DCC circuit, fails. A first minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of the failure. An inverted path from the signal source is selected and the various DCC circuit setting indices are cycled through again until the divider fails. A second minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of this second failure. The duty cycle is then calculated based on a difference of the first and second minimum pulse width values.
Public/Granted literature
- US20090125857A1 Design Structure for an Absolute Duty Cycle Measurement Circuit Public/Granted day:2009-05-14
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