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US08036013B2 Using higher current to read a triggered phase change memory 有权
使用更高的电流来读取触发的相变存储器

Using higher current to read a triggered phase change memory
Abstract:
A phase change memory cell may be read by driving a current through the cell higher than its threshold current. A voltage derived from the selected column may be utilized to read a selected bit of a phase change memory. The read window or margin may be improved in some embodiments. A refresh cycle may be included at periodic intervals.
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