Invention Grant
- Patent Title: Diagnostic parameter calculation method, system for diagnosis and diagnostic program
- Patent Title (中): 诊断参数计算方法,诊断和诊断程序系统
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Application No.: US11596981Application Date: 2005-05-19
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Publication No.: US08036733B2Publication Date: 2011-10-11
- Inventor: Kiyoshi Takizawa
- Applicant: Kiyoshi Takizawa
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2004-150375 20040520
- International Application: PCT/JP2005/009123 WO 20050519
- International Announcement: WO2005/112751 WO 20051201
- Main IPC: A61B5/04
- IPC: A61B5/04

Abstract:
A diagnostic parameter calculation method, system and program which detect symptomatically abnormal electrocardiogram data of a patient, using R-R intervals detected from electrocardiogram data collected for a patient to generate a time-series data, then generating a series of partial sets B(j)'s, each B(j) consisting of successive elements starting from the j-th element of the time-series data, and calculating characteristic quantity set (yj, xj) for each B(j), wherein yj is the mean value of all elements, and xj is the mean value of each difference of the first element from each element in the B(j), then, after splitting the (y, x)-plane into lattices, parameters u, v, w are calculated as indices for diagnosis, wherein v is the number of lattices including only one characteristic quantity set, u is the difference subtracted v from the total number of the characteristic quantity sets, and w is the maximum number of characteristic quantity sets included in a lattice.
Public/Granted literature
- US20090012414A1 Diagnostic Parameter Calculation Method, System for Diagnosis and Diagnostic Program Public/Granted day:2009-01-08
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