Invention Grant
- Patent Title: Property description coverage measuring apparatus
- Patent Title (中): 物业描述覆盖测量仪器
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Application No.: US12054610Application Date: 2008-03-25
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Publication No.: US08037002B2Publication Date: 2011-10-11
- Inventor: Takeo Imai , Yusuke Endoh
- Applicant: Takeo Imai , Yusuke Endoh
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Turocy & Watson, LLP
- Priority: JP2007-086014 20070328; JP2008-070323 20080318
- Main IPC: G06F17/00
- IPC: G06F17/00 ; G06N5/02

Abstract:
A design automaton extractor extracts a design automaton from design description data, and a property automaton extractor extracts a property automaton from property description data corresponding to the design description data. A matched state detector counts all states of the design automaton, detects matched states matching the property automaton from all the states of the design automaton, and counts the matched states. A coverage calculator obtains a ratio of the number of matched states to the number of all the states of the design automaton, thereby calculating a coverage representing the degree of correspondence of the property description data to the design description data.
Public/Granted literature
- US20080243747A1 PROPERTY DESCRIPTION COVERAGE MEASURING APPARATUS Public/Granted day:2008-10-02
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