Invention Grant
- Patent Title: Device and method for a system analysis and diagnosis
- Patent Title (中): 用于系统分析和诊断的设备和方法
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Application No.: US11576071Application Date: 2005-09-28
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Publication No.: US08037005B2Publication Date: 2011-10-11
- Inventor: Didieb Willaeys , Abdallah Asse
- Applicant: Didieb Willaeys , Abdallah Asse
- Applicant Address: FR Rueil Malmaison
- Assignee: Prosyst
- Current Assignee: Prosyst
- Current Assignee Address: FR Rueil Malmaison
- Agency: Ladas & Parry LLP
- Priority: FR0410271 20040928
- International Application: PCT/FR2005/002400 WO 20050928
- International Announcement: WO2006/035163 WO 20060406
- Main IPC: G06N5/02
- IPC: G06N5/02

Abstract:
A device and a method for the analysis and troubleshooting of a system, based on the use of a model of the system, with application in particular in the area of industrial installations controlled by automatic control systems of the programmed or wired logic type. The method includes a stage for initialisation of the model, and a stage for the creation of a list of discordant variables whose value in the system differs from that predicted by the model. For each of the variables belonging to a discordance list, an initial list of suspect variables, suspected of having generated the discordant value, is created, and then a restricted list of suspect variables is obtained by filtration of the initial list.
Public/Granted literature
- US20080086288A1 Device And Method For A System Analysis And Diagnosis Public/Granted day:2008-04-10
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