Invention Grant
- Patent Title: Apparatus and method for testing setup/hold time
- Patent Title (中): 用于测试设置/保持时间的设备和方法
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Application No.: US12346663Application Date: 2008-12-30
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Publication No.: US08037372B2Publication Date: 2011-10-11
- Inventor: Jeong-Hun Lee
- Applicant: Jeong-Hun Lee
- Applicant Address: KR
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR
- Agency: Baker & McKenzie LLP
- Priority: KR10-2008-0093532 20080924
- Main IPC: G11B20/20
- IPC: G11B20/20 ; G11C29/00 ; G01R31/28 ; H03L7/00 ; H03L7/06 ; H03K5/12 ; H03H11/26
Abstract:
An apparatus for testing setup/hold time includes a plurality of data input units, each configured to calibrate setup/hold time of input data in response to selection signals and setup/hold calibration signals, and an off-chip driver calibration unit configured to generate the selection signals and the setup/hold calibration signals by using the input data input of one of the plurality of data input units.
Public/Granted literature
- US20100077268A1 APPARATUS AND METHOD FOR TESTING SETUP/HOLD TIME Public/Granted day:2010-03-25
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