Invention Grant
- Patent Title: Automatic test entry termination in a memory device
- Patent Title (中): 存储设备中的自动测试条目终止
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Application No.: US11452696Application Date: 2006-06-14
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Publication No.: US08037378B2Publication Date: 2011-10-11
- Inventor: Frankie F. Roohparvar
- Applicant: Frankie F. Roohparvar
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert Jay & Polglaze, P.A.
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C7/00
Abstract:
A memory device has a control register comprising a test mode disable bit. The test mode is initially enabled. If the device does not receive an appropriate key or command as the next command received, the test mode is disabled. If the appropriate key is received, the test mode is continued to be enabled until it is expressly disabled by the user.
Public/Granted literature
- US20060236164A1 Automatic test entry termination in a memory device Public/Granted day:2006-10-19
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