Invention Grant
- Patent Title: Dual emission microscope
- Patent Title (中): 双排放显微镜
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Application No.: US12141378Application Date: 2008-06-18
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Publication No.: US08040513B2Publication Date: 2011-10-18
- Inventor: Rainer Uhl
- Applicant: Rainer Uhl
- Applicant Address: DE Graefelfing DE Munich
- Assignee: TILL I.D. GmbH,Ludwigs-Maximilians-Universitaet Muenchen
- Current Assignee: TILL I.D. GmbH,Ludwigs-Maximilians-Universitaet Muenchen
- Current Assignee Address: DE Graefelfing DE Munich
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent David S. Safran
- Main IPC: G01J3/36
- IPC: G01J3/36 ; G01J3/51 ; G02B21/36

Abstract:
There is provided a microscope device comprising: means for creating a collimated beam of light collected from a sample and comprising at least a first spectral range and a second spectral range, means for separating the collimated beam into a first beam containing a higher percentage of light of the first spectral range than light of the second spectral range and a second beam containing a lower percentage of light of the first spectral range than light of the second spectral range, means for reflecting the first beam, means for reflecting the second beam, means for combining the first beam and the second beam, a detector, and means for imaging the combined first and second beam onto the detector in order to create an image of the sample on the detector, wherein the means for reflecting the first beam and the means for reflecting the second beam are arranged in such a manner that the image created by the first beam and the image created by the second beam are shifted relative to each other on the detector, wherein the means for reflecting the first beam is adapted to invert handedness of the first beam, and wherein the means for reflecting the second beam is adapted to preserve handedness of the second beam.
Public/Granted literature
- US20090316258A1 DUAL EMISSION MICROSCOPE Public/Granted day:2009-12-24
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