Invention Grant
US08042012B2 Systems and devices including memory with built-in self test and methods of making and using the same
有权
系统和设备，包括具有内置自检功能的内存，以及使用它们的方法
- Patent Title: Systems and devices including memory with built-in self test and methods of making and using the same
- Patent Title (中): 系统和设备，包括具有内置自检功能的内存，以及使用它们的方法
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Application No.: US12903936Application Date: 2010-10-13
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Publication No.: US08042012B2Publication Date: 2011-10-18
- Inventor: R. Jacob Baker
- Applicant: R. Jacob Baker
- Applicant Address: US ID Bosie
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Bosie
- Agency: Fletcher Yoder
- Main IPC: G11C29/00
- IPC: G11C29/00
Abstract:
Disclosed are methods, systems and devices, such as a device including a data location, a quantizing circuit coupled to the data location, and a test module coupled to the quantizing circuit. The quantizing circuit may include an analog-to-digital converter, a switch coupled to the memory element and a feedback signal path coupled to the output of the analog-to-digital converter and to the switch.
Public/Granted literature
- US20110035637A1 SYSTEMS AND DEVICES INCLUDING MEMORY WITH BUILT-IN SELF TEST AND METHODS OF MAKING AND USING THE SAME Public/Granted day:2011-02-10
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