Invention Grant
- Patent Title: Semiconductor apparatus and method of disposing observation flip-flop
- Patent Title (中): 半导体装置及观察触发器的配置方法
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Application No.: US11797589Application Date: 2007-05-04
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Publication No.: US08042014B2Publication Date: 2011-10-18
- Inventor: Masahiko Hayashi
- Applicant: Masahiko Hayashi
- Applicant Address: JP Kawasaki-shi, Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kawasaki-shi, Kanagawa
- Agency: McGinn Intellectual Property Law Group, PLLC
- Priority: JP2006-131977 20060510
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R27/28 ; G01R31/00 ; G01R31/14 ; G01L15/00 ; G06F11/22 ; G06F17/50
Abstract:
A semiconductor apparatus includes a functional block to observe a state of a signal line in the apparatus. The functional block includes a signal transfer section to receive, transmit and output the state of the signal line, and an observation flip-flop to store a state of an input terminal or an output terminal of the signal transfer section.
Public/Granted literature
- US20070283203A1 Semiconductor apparatus and method of disposing observation flip-flop Public/Granted day:2007-12-06
Information query
