Invention Grant
- Patent Title: Circuit and method for avoiding soft errors in storage devices
- Patent Title (中): 避免存储设备软错误的电路和方法
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Application No.: US12164760Application Date: 2008-06-30
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Publication No.: US08042071B2Publication Date: 2011-10-18
- Inventor: William C. Moyer , Troy L. Cooper
- Applicant: William C. Moyer , Troy L. Cooper
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Joanna G. Chiu
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A storage element within a circuit design is identified. The storage element is replaced with both a first storage cell and a second storage cell. The second storage cell operates as a redundant storage cell to the first storage cell. An output of the first storage cell is connected to a first input of a comparator and an output of the second storage cell is connected to a second input of the comparator. The comparator provides an error indicator. Placement of the first storage cell, the second storage cell, the comparator, and one or more intervening cells is determined. The one or more intervening cells are placed between the first storage cell and the second storage cell. An integrated circuit is created using the comparator, the first storage cell, the second storage cell, the one or more intervening cells, and the determined placement.
Public/Granted literature
- US20090322411A1 CIRCUIT AND METHOD FOR AVOIDING SOFT ERRORS IN STORAGE DEVICES Public/Granted day:2009-12-31
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