Invention Grant
- Patent Title: Survey meter
- Patent Title (中): 测量仪表
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Application No.: US11938507Application Date: 2007-11-12
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Publication No.: US08044356B2Publication Date: 2011-10-25
- Inventor: Akio Sumita , Syunichiro Makino , Mikio Izumi , Tetsuo Goto
- Applicant: Akio Sumita , Syunichiro Makino , Mikio Izumi , Tetsuo Goto
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JPP2006-306570 20061113
- Main IPC: G01T1/20
- IPC: G01T1/20

Abstract:
A survey meter for measuring a radioactive contamination caused in an inner surface of a pipe includes a radiation detecting section and a signal processing section. The radiation detecting section includes a rod-shaped light guide unit, a reflecting portion connected to one end surface of the light guide unit, a photoelectric transfer unit, for outputting an electronic signal, connected to another one end surface of the light guide unit, and a scintillator unit provided to a circumference of the light guide unit. The signal processing section includes a pulse height discriminator for outputting a logic signal at a time when a pulse height value of the electronic signal outputted from the photoelectric transfer unit is higher than a threshold value, a counter unit for counting the logic signal, a contamination judging unit for judging whether a radioactive contamination is caused or not, and a display unit for displaying the value counted by the counter unit and a contamination judging result judged by the contamination judging unit.
Public/Granted literature
- US20100282975A1 SURVEY METER Public/Granted day:2010-11-11
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