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US08044370B2 Gas ion source with high mechanical stability 有权
气体离子源具有较高的机械稳定性

Gas ion source with high mechanical stability
Abstract:
A gas field ion source is described for a charged particle beam device having a charged particle beam column. The gas field ion source includes an emitter unit, a cooling unit, and a thermal conductivity unit for thermal conductivity from the cooling unit to the emitter unit, wherein the thermal conductivity unit is adapted for reduction of vibration transfer from the cooling unit to the emitter unit.
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