An apparatus for detecting failures in an illumination device includes at least two light emitting diodes connected in series. The apparatus includes a first, a second, and a third circuit node for interfacing the illumination device such that the voltage drop across at least two light emitting diodes is applied between the first and the second circuit node and a fraction of the voltage drop is applied between the second and the third circuit node. An evaluation unit is coupled to the first, the second, and the third circuit node and configured to assess whether the electric potential present at the third circuit node is within a pre-defined range of tolerance about a nominal value that is defined as a pre-defined fraction of the potential difference present between the first and the second circuit node.