Invention Grant
- Patent Title: Admittance meter for monitoring a medium
- Patent Title (中): 导纳仪用于监测介质
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Application No.: US12482638Application Date: 2009-06-11
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Publication No.: US08044669B2Publication Date: 2011-10-25
- Inventor: Jaromir Palata , Jochen Gundlach
- Applicant: Jaromir Palata , Jochen Gundlach
- Applicant Address: DE Essen
- Assignee: ifm electronic GmbH
- Current Assignee: ifm electronic GmbH
- Current Assignee Address: DE Essen
- Agency: MacMillan, Sobanski & Todd, LLC
- Main IPC: G01R27/04
- IPC: G01R27/04 ; B67D7/14 ; G01F23/26

Abstract:
An admittance meter having an electrical alternating signal source, a diode ring operated as a synchronous rectifier with at least four diodes connected in series and in the same direction in succession, a measuring sensor, and an evaluation unit. The diode ring is subjected to an alternating signal via first second feed points, which are each connected via two series-connected diodes. The measuring sensor is connected to the first feed point, and the evaluation unit is connected to a first or a second measurement point of the diode ring. The first and second measurement points are each connected via one diode to the first and second feed points, respectively.
Public/Granted literature
- US20100313653A1 Admittance meter for monitoring a medium Public/Granted day:2010-12-16
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