Invention Grant
US08044671B2 Method for servicing an apparatus for capacitive ascertaining and/or monitoring of a process variable
有权
用于维护用于电容性确定和/或监视过程变量的装置的方法
- Patent Title: Method for servicing an apparatus for capacitive ascertaining and/or monitoring of a process variable
- Patent Title (中): 用于维护用于电容性确定和/或监视过程变量的装置的方法
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Application No.: US12010011Application Date: 2008-01-18
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Publication No.: US08044671B2Publication Date: 2011-10-25
- Inventor: Volker Dreyer , Armin Wernet , Roland Dieterle
- Applicant: Volker Dreyer , Armin Wernet , Roland Dieterle
- Applicant Address: DE Maulburg
- Assignee: Endress + Hauser GmbH + Co. KG
- Current Assignee: Endress + Hauser GmbH + Co. KG
- Current Assignee Address: DE Maulburg
- Agency: Bacon & Thomas, PLLC
- Priority: DE102007003887 20070119
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
A method for servicing, especially checking, an apparatus for capacitive ascertaining and/or monitoring at least one process variable of a medium, wherein the apparatus has at least one probe unit with a probe electrode and an auxiliary electrode. The probe electrode and/or the auxiliary electrode are/is supplied at least with one test signal or connected with at least one electrical potential, that at least one response signal is tapped from the probe unit, and that, at least from the response signal and a predeterminable desired value, information is obtained concerning the apparatus.
Public/Granted literature
- US20080297177A1 Method for servicing an apparatus for capacitive ascertaining and/or monitoring of a process variable Public/Granted day:2008-12-04
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