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US08044680B2 Semiconductor memory device and on-die termination circuit 失效
半导体存储器件和片上终端电路

Semiconductor memory device and on-die termination circuit
Abstract:
An on-die termination (ODT) circuit including drive signal generators, each drive signal generator configured to generate a corresponding plurality of ODT drive signals; and ODT drive units, each ODT drive unit configured to terminate a corresponding terminal with a termination resistance in response to the ODT drive signals of a corresponding drive signal generator. The drive signal generators are configured to supply the ODT drive signals to the ODT drive units to output a plurality of ODT control signals through the terminals in a test mode.
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