Invention Grant
US08045417B2 Analyzing 2-D surface and/or borehole seismic data to locate subsurface diffractors
失效
分析2-D表面和/或井眼地震数据以定位地下衍射器
- Patent Title: Analyzing 2-D surface and/or borehole seismic data to locate subsurface diffractors
- Patent Title (中): 分析2-D表面和/或井眼地震数据以定位地下衍射器
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Application No.: US12471918Application Date: 2009-05-26
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Publication No.: US08045417B2Publication Date: 2011-10-25
- Inventor: Stewart A. Levin
- Applicant: Stewart A. Levin
- Applicant Address: US TX Houston
- Assignee: Landmark Graphics Corporation
- Current Assignee: Landmark Graphics Corporation
- Current Assignee Address: US TX Houston
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Mark K. Brightwell
- Main IPC: G01V1/34
- IPC: G01V1/34 ; G01V1/30

Abstract:
A system and method for locating subsurface diffractors. The method operates on two-dimensional (2-D) seismic data that includes one or more 2-D seismic lines. The 2-D seismic data may be preprocessed to enhance diffracted energy. For each hypothetical diffractor location in a set of hypothetical diffractor locations, the method involves analyzing at least a subset of the seismic traces of the one or more 2-D seismic lines, in order to compute a value indicating an extent to which those seismic traces contain diffraction arrivals consistent with the hypothetical diffractor location. The method may further involve generating, storing and displaying an image (or map) based on the computed values. The image may illustrate areas of high, intermediate and low diffraction, and may be used to assess the formation.
Public/Granted literature
- US20090228255A1 Analyzing 2-D Surface and/or Borehole Seismic Data to Locate Subsurface Diffractors Public/Granted day:2009-09-10
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