Invention Grant
US08045605B2 Jitter amplifier circuit, signal generation circuit, semiconductor chip, and test apparatus
失效
抖动放大器电路，信号发生电路，半导体芯片和测试装置
- Patent Title: Jitter amplifier circuit, signal generation circuit, semiconductor chip, and test apparatus
- Patent Title (中): 抖动放大器电路，信号发生电路，半导体芯片和测试装置
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Application No.: US11616010Application Date: 2006-12-25
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Publication No.: US08045605B2Publication Date: 2011-10-25
- Inventor: Kiyotaka Ichiyama , Masahiro Ishida
- Applicant: Kiyotaka Ichiyama , Masahiro Ishida
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: H04B3/46
- IPC: H04B3/46 ; H04B17/00 ; H04Q1/20
Abstract:
There is provided a jitter amplifier circuit for amplifying jitter included in an input signal. The jitter amplifier circuit includes a distorting circuit that receives the input signal, and distorts a waveform of the input signal so as to generate a harmonic component of the input signal, and a filter that passes, out of the distorted signal output from the distorting circuit, a harmonic component of a certain order which is determined in accordance with an amplification ratio of amplifying the jitter.
Public/Granted literature
- US20080151981A1 JITTER AMPLIFIER CIRCUIT, SIGNAL GENERATION CIRCUIT, SEMICONDUCTOR CHIP, AND TEST APPARATUS Public/Granted day:2008-06-26
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