Invention Grant
- Patent Title: Built-in self-test using embedded memory and processor in an application specific integrated circuit
- Patent Title (中): 内置自检使用嵌入式内存和处理器在专用集成电路中
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Application No.: US13028033Application Date: 2011-02-15
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Publication No.: US08046652B2Publication Date: 2011-10-25
- Inventor: Richard D. Taylor , Mark D. Montierth , Melvin D. Bodily , Gary D. Zimmerman , John D. Marshall
- Applicant: Richard D. Taylor , Mark D. Montierth , Melvin D. Bodily , Gary D. Zimmerman , John D. Marshall
- Applicant Address: BM Hamilton
- Assignee: Marvell International Tecnology Ltd.
- Current Assignee: Marvell International Tecnology Ltd.
- Current Assignee Address: BM Hamilton
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A test method for an ASIC uses an embedded processor in the ASIC to execute test routines from an embedded memory or an external memory. During ASIC production, the test routines can comprehensively test of the blocks of the ASIC without a complicated test pattern from test equipment. The test routines can also perform power-up tests in systems or end products containing the ASIC. Test selection, activation, and result output can be implement using a few terminals of the ASIC.
Public/Granted literature
- US20110138241A1 BUILT-IN SELF-TEST USING EMBEDDED MEMORY AND PROCESSOR IN AN APPLICATION SPECIFIC INTEGRATED CIRCUIT Public/Granted day:2011-06-09
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