Invention Grant
- Patent Title: Automatic analyzer
- Patent Title (中): 自动分析仪
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Application No.: US12032353Application Date: 2008-02-15
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Publication No.: US08048374B2Publication Date: 2011-11-01
- Inventor: Teruhiro Yamano
- Applicant: Teruhiro Yamano
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2007-037307 20070219
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N31/00 ; G01N33/00

Abstract:
An object of the present invention is to provide an automatic analysis method and an automatic analyzer which are suitable for improving throughput by changing reagents during analysis without placing a load on an operator, and without stopping the analysis. There is provided an automatic analysis method comprising the steps of: while moving a reagent transfer mechanism with respect to a reagent pipettor, dispensing a reagent placed in the reagent transfer mechanism by use of the reagent pipettor to cause a sample to react with the dispensed reagent; and measuring the reacted sample so as to analyze specified analysis items of the sample. A reagent is transferred from a reagent storage unit to a reagent changing mechanism. Then, the reagent changing mechanism is moved in synchronization with the reagent transfer mechanism so that reagents are changed during the synchronization.
Public/Granted literature
- US20080199358A1 AUTOMATIC ANALYZER Public/Granted day:2008-08-21
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