Invention Grant
US08049494B2 Flexible array probe for the inspection of a contoured surface with varying cross-sectional geometry
有权
灵活的阵列探头用于检查具有不同横截面几何形状的轮廓表面
- Patent Title: Flexible array probe for the inspection of a contoured surface with varying cross-sectional geometry
- Patent Title (中): 灵活的阵列探头用于检查具有不同横截面几何形状的轮廓表面
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Application No.: US12123834Application Date: 2008-05-20
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Publication No.: US08049494B2Publication Date: 2011-11-01
- Inventor: Benoit Lepage , Martin Roy , Stefano Orsi
- Applicant: Benoit Lepage , Martin Roy , Stefano Orsi
- Applicant Address: US MA Waltham
- Assignee: Olympus NDT
- Current Assignee: Olympus NDT
- Current Assignee Address: US MA Waltham
- Agency: Ostrolenk Faber LLP
- Main IPC: G01N27/82
- IPC: G01N27/82 ; G01N27/90

Abstract:
A flexible array probe is disclosed suitable for use in the non-destructive testing and inspection of test pieces with varying cross-sectional geometries. Array elements—such as, but not limited to, eddy current sensors, piezoelectric sensor elements, and magnetic flux leakage sensors—are mounted on thin alignment fins and coupled together with pairs of pivot mechanisms along the axis of desired rotation. The pivot mechanisms allow rotation in exactly one dimension and force the flexible array probe to align its elements orthogonally to the surface of the structure under test. Alignment and coupling fixtures are also disclosed.
Public/Granted literature
- US20080315871A1 FLEXIBLE ARRAY PROBE FOR THE INSPECTION OF A CONTOURED SURFACE WITH VARYING CROSS-SECTIONAL GEOMETRY Public/Granted day:2008-12-25
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