Invention Grant
- Patent Title: Method for the adjustment of a device under test
- Patent Title (中): 用于调整被测设备的方法
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Application No.: US12436426Application Date: 2009-05-06
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Publication No.: US08049513B2Publication Date: 2011-11-01
- Inventor: Achim Lott
- Applicant: Achim Lott
- Applicant Address: DE Freiburg I.BR.
- Assignee: Micronas GmbH
- Current Assignee: Micronas GmbH
- Current Assignee Address: DE Freiburg I.BR.
- Agency: Muncy, Geissler, Olds & Lowe, PLLC
- Priority: DE102008022365 20080506
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A method for adjusting an output signal produced by a device under test from an input variable by: a) positioning the device under test at a first test device with a physical disturbance variable and a known input variable value, b) acquiring at least one measured value for the output signal, c) changing the adjustment state, d) acquiring a further measured value for the output signal, e) positioning the device under test at a further test device having a further disturbance variable value and the input variable value, f) acquiring a further measured value for the output signal, g) changing the adjustment state, h) acquiring a further measured value for the output signal, i) comparing the measured values acquired at the test devices for each adjustment state and determining a first adjustment state in which the correlation between the measured values is larger than in a second adjustment state.
Public/Granted literature
- US20090278550A1 Method for the Adjustment of a Device Under Test Public/Granted day:2009-11-12
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