Invention Grant
- Patent Title: Solar parametric testing module and processes
- Patent Title (中): 太阳能参数测试模块和工艺
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Application No.: US12409732Application Date: 2009-03-24
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Publication No.: US08049521B2Publication Date: 2011-11-01
- Inventor: Danny Cam Toan Lu , Michel Marriott , Vicky Svidenko , Dapeng Wang , Michel R. Frei
- Applicant: Danny Cam Toan Lu , Michel Marriott , Vicky Svidenko , Dapeng Wang , Michel R. Frei
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, L.L.P.
- Main IPC: G01R27/08
- IPC: G01R27/08 ; H01L31/042

Abstract:
Embodiments of the present invention generally relate to a module that can test and analyze various regions of a solar cell device in an automated or manual fashion after one or more steps have been completed in the solar cell formation process. The module used to perform the automated testing and analysis processes can also be adapted to test a partially formed solar cell at various stages of the solar cell formation process within an automated solar cell production line. The automated solar cell production line is generally an arrangement of automated processing modules and automation equipment that is used to form solar cell devices.
Public/Granted literature
- US20090256581A1 SOLAR PARAMETRIC TESTING MODULE AND PROCESSES Public/Granted day:2009-10-15
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