Invention Grant
US08049524B2 Method for detecting component defects of an analog signal processing circuit, especially for a measurement transmitter
有权
用于检测模拟信号处理电路的组件缺陷的方法，特别是用于测量发射机的方法
- Patent Title: Method for detecting component defects of an analog signal processing circuit, especially for a measurement transmitter
- Patent Title (中): 用于检测模拟信号处理电路的组件缺陷的方法，特别是用于测量发射机的方法
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Application No.: US11922457Application Date: 2006-06-08
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Publication No.: US08049524B2Publication Date: 2011-11-01
- Inventor: Martin Gehrke , Friedrich Füβ
- Applicant: Martin Gehrke , Friedrich Füβ
- Applicant Address: DE Gerligen
- Assignee: Endress + Hauser Conducta Gesellschaft für Mess-und Regeltechnik mbH + Co. KG
- Current Assignee: Endress + Hauser Conducta Gesellschaft für Mess-und Regeltechnik mbH + Co. KG
- Current Assignee Address: DE Gerligen
- Agency: Bacon & Thomas, PLLC
- Priority: DE102005029615 20050623
- International Application: PCT/EP2006/062992 WO 20060608
- International Announcement: WO2006/136497 WO 20061228
- Main IPC: G01R31/00
- IPC: G01R31/00
Abstract:
A method for detecting component defects of an analog signal processing circuit, especially for a measurement transmitter. A test signal TS is generated at a first test point TP1 and an associated response signal RS tapped at a second test point TP2 and evaluated in a digital unit. In the evaluation, individual amplitude values of the response signal RS are compared with predetermined, desired values. In the case of significant deviations, a defect report is generated.
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