Invention Grant
US08049886B1 Spectrometer with adjustable-deflector-controlled alignment for optical coherence tomography 有权
光学相干断层扫描仪带有可调偏转控制对准的光谱仪

  • Patent Title: Spectrometer with adjustable-deflector-controlled alignment for optical coherence tomography
  • Patent Title (中): 光学相干断层扫描仪带有可调偏转控制对准的光谱仪
  • Application No.: US12904681
    Application Date: 2010-10-14
  • Publication No.: US08049886B1
    Publication Date: 2011-11-01
  • Inventor: Ferenc Raksi
  • Applicant: Ferenc Raksi
  • Applicant Address: US CA Aliso Viejo
  • Assignee: Alcon LenSx, Inc.
  • Current Assignee: Alcon LenSx, Inc.
  • Current Assignee Address: US CA Aliso Viejo
  • Agent Gergely T. Zimanyi
  • Main IPC: G01J3/28
  • IPC: G01J3/28
Spectrometer with adjustable-deflector-controlled alignment for optical coherence tomography
Abstract:
A spectrometer is presented that can include a spectrally dispersive optical element to spectrally disperse a received light, a leveraged-optics adjustable deflector to adjustably deflect the spectrally dispersed light, and a detector array to receive the spectrally dispersed and adjustably deflected light. The received light can include an interference beam combined from a returned image beam and a reference beam in a Spectral Domain Optical Coherence Tomograph. The detector array can include a linear sensor array. The leveraged-optics adjustable deflector can include an optical element with an adjustable transmissive property or an adjustable reflective property, wherein the adjustable deflector is adjustable by a mechanical adjustment being optically leveraged into a smaller optical adjustment.
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