Invention Grant
US08049886B1 Spectrometer with adjustable-deflector-controlled alignment for optical coherence tomography
有权
光学相干断层扫描仪带有可调偏转控制对准的光谱仪
- Patent Title: Spectrometer with adjustable-deflector-controlled alignment for optical coherence tomography
- Patent Title (中): 光学相干断层扫描仪带有可调偏转控制对准的光谱仪
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Application No.: US12904681Application Date: 2010-10-14
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Publication No.: US08049886B1Publication Date: 2011-11-01
- Inventor: Ferenc Raksi
- Applicant: Ferenc Raksi
- Applicant Address: US CA Aliso Viejo
- Assignee: Alcon LenSx, Inc.
- Current Assignee: Alcon LenSx, Inc.
- Current Assignee Address: US CA Aliso Viejo
- Agent Gergely T. Zimanyi
- Main IPC: G01J3/28
- IPC: G01J3/28

Abstract:
A spectrometer is presented that can include a spectrally dispersive optical element to spectrally disperse a received light, a leveraged-optics adjustable deflector to adjustably deflect the spectrally dispersed light, and a detector array to receive the spectrally dispersed and adjustably deflected light. The received light can include an interference beam combined from a returned image beam and a reference beam in a Spectral Domain Optical Coherence Tomograph. The detector array can include a linear sensor array. The leveraged-optics adjustable deflector can include an optical element with an adjustable transmissive property or an adjustable reflective property, wherein the adjustable deflector is adjustable by a mechanical adjustment being optically leveraged into a smaller optical adjustment.
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