Invention Grant
- Patent Title: Multiple wavelength optical analyzer device
- Patent Title (中): 多波长光学分析仪器
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Application No.: US11867956Application Date: 2007-10-05
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Publication No.: US08049894B2Publication Date: 2011-11-01
- Inventor: Jing Jong Pan , Zhengda Pang , Yonghong Guo
- Applicant: Jing Jong Pan , Zhengda Pang , Yonghong Guo
- Applicant Address: US CA Milpitas
- Assignee: Lightwaves 2020, Inc.
- Current Assignee: Lightwaves 2020, Inc.
- Current Assignee Address: US CA Milpitas
- Agency: Aka Chan LLP
- Main IPC: G01J3/51
- IPC: G01J3/51 ; H01J40/14

Abstract:
A device and method of operation for analyzing signal features over multiple optical wavelengths is presented. A plurality of rotating thin film filters is arranged with respect to a collimated beam of light so that each thin film filter transmits light of a particular wavelength to a detector unit responsive to an angle of incidence of light upon the thin film filter when the thin film filter optically interposes the collimated light beam. Each of the plurality of thin film filters is optically interposed periodically and rotated so that the angle of incidence of light from the first input unit upon the thin film filter varies when the thin film filter is optically interposed to scan the light by wavelength within a selected wavelength band into a detector unit for measurement.
Public/Granted literature
- US20090091759A1 Multiple Wavelength Optical Analyzer Device Public/Granted day:2009-04-09
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