Invention Grant
- Patent Title: Non-volatile memory device and bad block remapping method
- Patent Title (中): 非易失性存储器件和坏块重映射方法
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Application No.: US12458999Application Date: 2009-07-29
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Publication No.: US08050093B2Publication Date: 2011-11-01
- Inventor: Wook-ghee Hahn , Jai-ick Son , Youn-yeol Lee
- Applicant: Wook-ghee Hahn , Jai-ick Son , Youn-yeol Lee
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2008-0083027 20080825
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
A non-volatile memory device and a bad block remapping method use some of main blocks as remapping blocks to replace a bad block in a main cell block and selects remapping blocks using existing block address signals. Thus, separate bussing of remapping block address signals is not needed. The bad block remapping includes comparing an external block address input from an external source to a stored bad block address, generating a bad block flag signal when the external block address is identical to the stored bad block address, generating a remapping block address selecting the remapping blocks in response to a remapping address corresponding to the bad block address, selecting one of the external block address and the remapping block address in response to the bad block flag signal to create a selected address, and outputting a row address signal in accordance with the selected address.
Public/Granted literature
- US20100046292A1 Non-volatile memory device and bad block remapping method Public/Granted day:2010-02-25
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