Invention Grant
US08050122B2 Fuse apparatus for controlling built-in self stress and control method thereof 失效
用于控制内置自应力的保险丝装置及其控制方法

  • Patent Title: Fuse apparatus for controlling built-in self stress and control method thereof
  • Patent Title (中): 用于控制内置自应力的保险丝装置及其控制方法
  • Application No.: US12266521
    Application Date: 2008-11-06
  • Publication No.: US08050122B2
    Publication Date: 2011-11-01
  • Inventor: Jin-Il Chung
  • Applicant: Jin-Il Chung
  • Applicant Address: KR Gyeonggi-do
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Agency: IP & T Group LLP
  • Priority: KR10-2007-0131035 20071214
  • Main IPC: G11C29/00
  • IPC: G11C29/00
Fuse apparatus for controlling built-in self stress and control method thereof
Abstract:
A fuse apparatus for controlling a built-in self stress unit includes a built-in self stress configured to repeatedly generate any stress test pattern in a test mode, and generate a one-cycle end signal when one cycle for the generated stress test pattern has ended, and a fuse configured to record an operation state of the built-in self stress according to the one-cycle end signal. A method for controlling a built-in self stress includes repeatedly generating any stress test mode, in a test mode counting the generated stress test pattern, and activating a cycle end signal when a counting value reaches a predetermined value, and recording an operation state of the built-in self stress in a fuse on the basis of the counted value.
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