Invention Grant
US08050122B2 Fuse apparatus for controlling built-in self stress and control method thereof
失效
用于控制内置自应力的保险丝装置及其控制方法
- Patent Title: Fuse apparatus for controlling built-in self stress and control method thereof
- Patent Title (中): 用于控制内置自应力的保险丝装置及其控制方法
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Application No.: US12266521Application Date: 2008-11-06
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Publication No.: US08050122B2Publication Date: 2011-11-01
- Inventor: Jin-Il Chung
- Applicant: Jin-Il Chung
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2007-0131035 20071214
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
A fuse apparatus for controlling a built-in self stress unit includes a built-in self stress configured to repeatedly generate any stress test pattern in a test mode, and generate a one-cycle end signal when one cycle for the generated stress test pattern has ended, and a fuse configured to record an operation state of the built-in self stress according to the one-cycle end signal. A method for controlling a built-in self stress includes repeatedly generating any stress test mode, in a test mode counting the generated stress test pattern, and activating a cycle end signal when a counting value reaches a predetermined value, and recording an operation state of the built-in self stress in a fuse on the basis of the counted value.
Public/Granted literature
- US20090154272A1 FUSE APPARATUS FOR CONTROLLING BUILT-IN SELF STRESS AND CONTROL METHOD THEREOF Public/Granted day:2009-06-18
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