Invention Grant
- Patent Title: Characterizing frequency response of a multirate system
- Patent Title (中): 表征多速率系统的频率响应
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Application No.: US12201915Application Date: 2008-08-29
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Publication No.: US08050160B2Publication Date: 2011-11-01
- Inventor: Eric R. Dunn
- Applicant: Eric R. Dunn
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Patterson & Sheridan, LLP
- Main IPC: G11B20/00
- IPC: G11B20/00

Abstract:
Frequency response is characterized for mechanical components of a multirate system operating in a closed-loop environment. A disturbance is injected at the frequency of interest and at each of the alias frequencies thereof as an input into the multirate system, and a matrix equation composed of resulting measurements of the response of the multirate system is solved to compute the frequency response at the frequency of interest and at each of the alias frequencies. The resulting frequency response can be used to synthesize the transfer function of the entire system, which allows simulation and evaluation of the relative performance of multiple controller designs without the need for further frequency response measurements.
Public/Granted literature
- US20100054098A1 CHARACTERIZING FREQUENCY RESPONSE OF A MULTIRATE SYSTEM Public/Granted day:2010-03-04
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