Invention Grant
US08050779B2 Model structure parameter decision method, parameter decision device, control device, and temperature adjustment device
失效
模型结构参数决策方法，参数决策装置，控制装置和温度调节装置
- Patent Title: Model structure parameter decision method, parameter decision device, control device, and temperature adjustment device
- Patent Title (中): 模型结构参数决策方法，参数决策装置，控制装置和温度调节装置
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Application No.: US11816259Application Date: 2006-02-16
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Publication No.: US08050779B2Publication Date: 2011-11-01
- Inventor: Ikuo Nanno
- Applicant: Ikuo Nanno
- Applicant Address: JP Kyoto
- Assignee: Omron Corporation
- Current Assignee: Omron Corporation
- Current Assignee Address: JP Kyoto
- Agency: Foley & Lardner LLP
- Priority: JP2005-043159 20050218
- International Application: PCT/JP2006/302692 WO 20060216
- International Announcement: WO2006/088072 WO 20060824
- Main IPC: G05B13/02
- IPC: G05B13/02
Abstract:
To easily decide parameters of a model structure of a controlled object suitable for non-interference control.Parameters K and T of a model structure (A structure) comprising a plurality of inputs and a plurality of outputs, wherein a difference on the output side is fed back to the input side, are calculated based on parameters a and b of a black box model (P structure) calculated through system identification or the like in accordance with predetermined conversion expressions K=f(a,b) and T=f(a,b).
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