Invention Grant
- Patent Title: Periodic rate sensor self test
- Patent Title (中): 定期传感器自检
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Application No.: US12085605Application Date: 2006-11-30
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Publication No.: US08050816B2Publication Date: 2011-11-01
- Inventor: Kenneth A. Doll , Arnold H. Spieker
- Applicant: Kenneth A. Doll , Arnold H. Spieker
- Applicant Address: US MI Livonia
- Assignee: Kelsey-Hayes Company
- Current Assignee: Kelsey-Hayes Company
- Current Assignee Address: US MI Livonia
- Agency: MacMillan, Sobanski & Todd, LLC
- International Application: PCT/US2006/045821 WO 20061130
- International Announcement: WO2007/064782 WO 20070607
- Main IPC: G06F19/24
- IPC: G06F19/24
Abstract:
A periodic test signal (44) is injected into a sensor and the sensor output (46) is compared to a threshold to determined whether the sensor is functioning properly.
Public/Granted literature
- US20090277244A1 Periodic Rate Sensor Self Test Public/Granted day:2009-11-12
Information query
