Invention Grant
- Patent Title: Document analysis system and document adaptation system
- Patent Title (中): 文件分析系统和文件适应系统
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Application No.: US11577984Application Date: 2005-10-25
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Publication No.: US08051371B2Publication Date: 2011-11-01
- Inventor: Yuushin Tatsumi
- Applicant: Yuushin Tatsumi
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2004-310238 20041025
- International Application: PCT/JP2005/019531 WO 20051025
- International Announcement: WO2006/046523 WO 20060405
- Main IPC: G06F17/00
- IPC: G06F17/00

Abstract:
A document analysis system which can execute a layout analysis intended by a document provider and an exhaustive title analysis and output the analysis result which can be used by a third person is provided by the present invention. The input unit (11) obtains a structured or semi-structured document and renders it. The basic layout analysis unit (14) obtains the rendering result and analyzes the layout by grouping document description elements juxtaposed in a determined direction by referencing an arrangement of the document description elements. The title analysis unit (15) obtains the rendering result and a title analysis rule from the title analysis rule storing unit (23) and analyzes the title by comparing the name, attribute, style or the content of the document analysis elements with the title analysis rule. The layout analysis unit (16) obtains the layout components and the hierarchical relationship thereof and the titles for generating a new layout by grouping the layout components. The output unit (13) obtains the layout components and the hierarchical relationship thereof, the relationship between the components and the titles, shapes them into a format having an expression which uses the reference to the document description elements and output them.
Public/Granted literature
- US20080148144A1 Document Analysis System and Document Adaptation System Public/Granted day:2008-06-19
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