Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
- Patent Title (中): 半导体装置及其制造方法
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Application No.: US11259960Application Date: 2005-10-26
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Publication No.: US08053312B2Publication Date: 2011-11-08
- Inventor: Sang-Man Bae , Dong-Heok Park
- Applicant: Sang-Man Bae , Dong-Heok Park
- Applicant Address: KR Icheon-si
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Icheon-si
- Agency: Kilpatrick Townsend & Stockton LLP
- Priority: KR10-2004-0113894 20041228
- Main IPC: H01L21/336
- IPC: H01L21/336

Abstract:
A semiconductor device and a method for fabricating the same are provided. The method includes: forming a plurality of protruded patterns smaller than gate structures by selectively removing predetermined portions of a substrate; and forming the gate structures over the protruded patterns. The semiconductor device includes: a plurality of protruded substrate portions smaller than the gate structures; and a plurality of gate structures encompassing the protruded substrate portions, wherein channels are formed on surfaces of the protruded substrate portion.
Public/Granted literature
- US20060141694A1 Semiconductor device and method for fabricating the same Public/Granted day:2006-06-29
Information query
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