Invention Grant
US08053878B2 Substrate, semiconductor device using the same, method for inspecting semiconductor device, and method for manufacturing semiconductor device 有权
基板,使用该半导体装置的半导体装置,半导体装置的检查方法以及半导体装置的制造方法

Substrate, semiconductor device using the same, method for inspecting semiconductor device, and method for manufacturing semiconductor device
Abstract:
A substrate including therein a plurality of conductor layers laminated via insulating layers, the substrate mounting at least one semiconductor integrated circuit, wherein the substrate includes a first electrode terminal connected to the semiconductor integrated circuit, a second electrode terminal connected to a terminal on an upper substrate arranged in a layer over the substrate, and on at least part of the perimeter of the first and second electrode terminals, a third electrode terminal located outside the outer edge of the upper substrate.
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