Invention Grant
- Patent Title: Atomic magnetometer and magnetic force measuring method
- Patent Title (中): 原子磁力计和磁力测量方法
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Application No.: US12409789Application Date: 2009-03-24
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Publication No.: US08054074B2Publication Date: 2011-11-08
- Inventor: Sunao Ichihara , Natsuhiko Mizutani , Hideyuki Sugioka , Tetsuo Kobayashi , Kiyoshi Ishikawa , Shuji Taue
- Applicant: Sunao Ichihara , Natsuhiko Mizutani , Hideyuki Sugioka , Tetsuo Kobayashi , Kiyoshi Ishikawa , Shuji Taue
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fizpatrick, Cella, Harper & Scinto
- Priority: JP2008-081278 20080326
- Main IPC: G01V3/00
- IPC: G01V3/00

Abstract:
An atomic magnetometer includes a cell containing an atomic group, a pump light source, a probe light source, a mirror, and a detector. The cell is disposed between the pump light source and the mirror and between the probe light source and the detector. A pump beam emitted from the pump light source is circularly polarized light. The pump beam passes through the cell and is reflected by the mirror and then passes through the cell again. The probe beam emitted from the probe light source is linearly polarized light. An optical path of the probe beam is parallel to the plane of incidence of the pump beam and is also parallel to the surface of the mirror. The optical path of the probe beam crosses the optical path of the pump beam in the cell. The probe beam which has passed through the cell enters the detector.
Public/Granted literature
- US20090243610A1 ATOMIC MAGNETOMETER AND MAGNETIC FORCE MEASURING METHOD Public/Granted day:2009-10-01
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