Invention Grant
- Patent Title: Capacitance measuring circuit
- Patent Title (中): 电容测量电路
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Application No.: US11915183Application Date: 2006-05-24
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Publication No.: US08054089B2Publication Date: 2011-11-08
- Inventor: Johann Hauer , Stefan Moedl , Marcus Hartmann
- Applicant: Johann Hauer , Stefan Moedl , Marcus Hartmann
- Applicant Address: DE Munich
- Assignee: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.v.
- Current Assignee: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.v.
- Current Assignee Address: DE Munich
- Agency: Keating & Bennett, LLP
- Priority: DE102005024098 20050525; DE102005038875 20050817
- International Application: PCT/EP2006/004989 WO 20060524
- International Announcement: WO2006/125639 WO 20061130
- Main IPC: G01R31/08
- IPC: G01R31/08 ; H03M3/00

Abstract:
The present invention is based on the finding that a capacitance can be measured precisely and efficiently when, in a delta-sigma modulator having an operational amplifier, a first capacitor connectable to an input of the operational amplifier, and a second capacitor in a feedback branch of the operational amplifier, a reference signal source is connectable to the first capacitor, wherein the first or second capacitor may represent a capacitance to be measured. Due to the fact that, in contrast to what is conventional, no input quantity is measured and digitalized at the input of the delta-sigma modulator, but instead a defined reference signal source is coupled at the input and a device of the delta-sigma modulator itself represents the measuring quantity, an extremely compact circuit is provided allowing capacitances to be measured quickly and reliably, the measuring result being additionally made available in a digital form.
Public/Granted literature
- US20080191713A1 Capacitance Measuring Circuit Public/Granted day:2008-08-14
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