Invention Grant
- Patent Title: Broad band referencing reflectometer
- Patent Title (中): 宽带参考反射计
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Application No.: US12876242Application Date: 2010-09-07
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Publication No.: US08054453B2Publication Date: 2011-11-08
- Inventor: Dale A. Harrison
- Applicant: Dale A. Harrison
- Applicant Address: IL Migdal Ha'Emek
- Assignee: Jordan Valley Semiconductors Ltd.
- Current Assignee: Jordan Valley Semiconductors Ltd.
- Current Assignee Address: IL Migdal Ha'Emek
- Agency: D. Kligler I.P. Services Ltd.
- Main IPC: G01J3/00
- IPC: G01J3/00

Abstract:
A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized. Array based detection instrumentation may be exploited to permit the simultaneous collection of larger wavelength regions.
Public/Granted literature
- US20100328648A1 BROAD BAND REFERENCING REFLECTOMETER Public/Granted day:2010-12-30
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