Invention Grant
- Patent Title: Read, verify word line reference voltage to track source level
- Patent Title (中): 读取,验证字线参考电压以跟踪源电平
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Application No.: US12715858Application Date: 2010-03-02
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Publication No.: US08054681B2Publication Date: 2011-11-08
- Inventor: Feng Pan , Trung Pham , Byungki Woo
- Applicant: Feng Pan , Trung Pham , Byungki Woo
- Applicant Address: US TX Plano
- Assignee: SanDisk Technologies Inc.
- Current Assignee: SanDisk Technologies Inc.
- Current Assignee Address: US TX Plano
- Agency: Davis Wright Tremaine LLP
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
A non-volatile memory device has individual pages of memory cells to be sensed in parallel. The memory device includes a source level tracking circuit coupled to receive a predetermined word line voltage from a word line voltage supply and the voltage level at the aggregate source node of one or more pages and coupled to provide to word lines of the memory an output voltage during the sensing operation, where the source level tracking circuit includes an op amp whereby the output voltage is the word line voltage offset by an amount to track the voltage level at the aggregate node and compensate for source bias errors due to a finite resistance in the ground loop.
Public/Granted literature
- US20100157681A1 Read, Verify Word Line Reference Voltage to Track Source Level Public/Granted day:2010-06-24
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