Invention Grant
- Patent Title: Delay locked loop and semiconductor memory device with the same
- Patent Title (中): 延迟锁定环和半导体存储器件相同
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Application No.: US12615833Application Date: 2009-11-10
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Publication No.: US08054701B2Publication Date: 2011-11-08
- Inventor: Young-Jun Ku
- Applicant: Young-Jun Ku
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR2007-0030707 20070329
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A semiconductor memory device is capable of controlling a delay locked loop appropriately based on operation modes, particularly in a fast power-down mode to reduce an amount of current maximumly. The semiconductor memory device includes a delay-locked clock signal generating unit, a mode signal generating unit, and a delay locking control unit. The delay-locked clock signal generating unit performs a delay locking operation on a clock signal, thereby generating a delay-locked clock signal. The mode signal generating unit enables a fast precharge power-down mode signal in a fast precharge power-down mode. The delay locking control unit controls the delay-locked clock signal generating unit to be activated in a predetermined cycle in response to the fast precharge power-down mode signal.
Public/Granted literature
- US20100054060A1 DELAY LOCKED LOOP AND SEMICONDUCTOR MEMORY DEVICE WITH THE SAME Public/Granted day:2010-03-04
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