Invention Grant
US08054708B2 Power-on detector, operating method of power-on detector and memory device including the same
有权
上电检测器，上电检测器的操作方法和包括其的存储器件
- Patent Title: Power-on detector, operating method of power-on detector and memory device including the same
- Patent Title (中): 上电检测器，上电检测器的操作方法和包括其的存储器件
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Application No.: US12604116Application Date: 2009-10-22
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Publication No.: US08054708B2Publication Date: 2011-11-08
- Inventor: Mingun Park , Chanho Kim , Sangwon Hwang
- Applicant: Mingun Park , Chanho Kim , Sangwon Hwang
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2008-0120598 20081201
- Main IPC: G11C7/00
- IPC: G11C7/00
Abstract:
A power-on detector supplied with a power supply voltage from an external source and detects a variation of the power supply voltage. The operating method of the power-on detector comprises calculating the slope of the rise of power supply voltage from a first voltage to a second voltage higher than the first voltage; and calculating the expected time for the power supply voltage to reach a target voltage level, based on the calculated slope.
Public/Granted literature
- US20100135099A1 POWER-ON DETECTOR, OPERATING METHOD OF POWER-ON DETECTOR AND MEMORY DEVICE INCLUDING THE SAME Public/Granted day:2010-06-03
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