Invention Grant
- Patent Title: Systems and methods for using an intensity-modulated X-ray source
- Patent Title (中): 使用强度调制的X射线源的系统和方法
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Application No.: US12484172Application Date: 2009-06-12
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Publication No.: US08054937B2Publication Date: 2011-11-08
- Inventor: Willem G. J. Langeveld , William A. Johnson , Roger D. Owen , Russell G. Schonberg
- Applicant: Willem G. J. Langeveld , William A. Johnson , Roger D. Owen , Russell G. Schonberg
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
The present invention is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present invention further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.
Public/Granted literature
- US20100034355A1 Systems and Methods for Using An Intensity-Modulated X-Ray Source Public/Granted day:2010-02-11
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