Invention Grant
- Patent Title: Copy-forgery-inhibited pattern density parameter determination method, copy-forgery-inhibited pattern image generation method, and image processing
- Patent Title (中): 复制防伪图案密度参数确定方法,防伪图案图像生成方法和图像处理
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Application No.: US12509598Application Date: 2009-07-27
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Publication No.: US08055180B2Publication Date: 2011-11-08
- Inventor: Tomochika Murakami
- Applicant: Tomochika Murakami
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2003-324691 20030917; JP2003-324692 20030917
- Main IPC: G03G21/04
- IPC: G03G21/04 ; G06K15/00

Abstract:
A primary test printing process of a plurality of copy-forgery-inhibited pattern images generated by changing one or both of print densities of the latent-image and background-image parts in a first pattern on the basis of a predetermined parameter is performed. The user selects one copy-forgery-inhibited pattern image which has the latent-image and background-image parts with approximate print densities from the plurality of copy-forgery-inhibited pattern images generated by the primary test printing process. A secondary test printing process of a plurality of copy-forgery-inhibited pattern images generated by changing one or both of print densities of the latent-image and background-image parts in a second pattern on the basis of the parameter used to determine the print densities of the latent-image and background-image parts of the selected copy-forgery-inhibited pattern image is performed. The user selects one copy-forgery-inhibited pattern image which has the latent-image and background-image parts with approximate print densities from the plurality of copy-forgery-inhibited pattern images generated by the secondary test printing process, and the parameter of the selected copy-forgery-inhibited pattern image is determined as a copy-forgery-inhibited pattern density parameter.
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